Preparation of cross-section specimens for transmission electron microscopy from alpha-Al2O3/Ni solid state bonded bicrystal interfaces. |
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| Authors: | C Wan M Dupeux |
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| Affiliation: | Laboratoire de Thermodynamique et Physico-Chimie Métallurgiques, Domaine Universitaire, Saint Martin d'Hères, France. |
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| Abstract: | The technique which is described combines the advantages of the techniques formerly proposed in the literature in each stage of the preparation of transmission electron microscopy (TEM) specimens including a single metal-ceramic interface. It allows easy handling of the thin foils in spite of their brittleness. Preferential thinning of the softer material in the two-phase foil is prevented, and both sides of the interface are thinned down to comparable thicknesses. The nickel-alumina bicrystal interface observed in TEM is neat and free from any reaction layer. This method is easily adaptable to other metal-ceramic systems. |
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