SOC设计方法学和可测试性设计研究进展

随着微电子工艺技术和设计方法的发展，系统级芯片(SOC)设计成为解决日益增长的设计复杂度的主要方法。文章概述了SOC设计方法学和SOC可测试性设计的发展现状，阐述了目前SOC测试存在的和需要解决的问题，描述了目前开发的各种SOC测试结构和测试策略。最后，提出了今后进一步研究的方向。

An Overview of Design Methodology and Design for Testability for SOC's

With the development of microelectronics technology and design techniques, system-on-a-chip (SOC) is becoming one of the main solutions to handle the increasing complexity of IC design. Latest development of the design methodology and design for testability for SOC's are reviewed. Problems to be solved in testing SOC's are discussed,and different structures and strategies for SOC test are described. Finally, the development trend of SOC design methodology and design for testability are predicted.