Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach |
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Authors: | Franco Fummi Marco Boschini Xiaoming Yu Elizabeth M. Rudnick |
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Affiliation: | (1) DST Informatica, Università di Verona, Verona, Italy;(2) STMicroelectronics, Agrate, Milano, Italy;(3) Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL, USA |
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Abstract: | Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases. |
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Keywords: | automatic test generation binary decision diagrams finite state machine with datapath genetic algorithms |
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