On the use of the atomic force microscope to monitor physical degradation of polymeric coating surfaces |
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Authors: | Mark R VanLandingham Tinh Nguyen W Eric Byrd and Jonathan W Martin |
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Affiliation: | (1) National Institute of Standards and Technology, USA |
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Abstract: | The atomic force microscope (AFM) was used to monitor changes in surface features of an acrylic melamine coating that was
exposed to a variety of conditions. Exposure to ultraviolet (UV) radiation and high relative humidity caused general roughening
of the surface and the formation of pits. Further, the damage of the coating surface was much more substantial for exposure
to high relative humidity compared to exposure to dry environments. This difference in degradation rates correlated with measurements
of chemical degradation determined using infrared spectra that were acquired along with the AFM images.
Building Materials Division, 100 Bureau Dr., Stop 8621, Gaithersburg, MD 20899-8621. |
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