| BIT 的发展趋势 |
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| 引用本文： | 张宏伟,李志强,封吉平. BIT 的发展趋势[J]. 测试技术学报, 2001, 15(2): 105-108 |
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| 作者姓名： | 张宏伟 李志强 封吉平 |
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| 作者单位： | 军械工程学院光学与电子工程系, |
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| 摘 要： | 目的分析和研究BIT的发展趋势.方法论述BIT的发展并分析存在问题.结果新的测试、检测和故障诊断理论和方法促进了BIT的发展.结论BIT的发展趋势与ATE融和、综合诊断、智能化、与可测性设计结合.
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| 关 键 词： | BIT ATE 综合诊断 人工智能 专家系统 神经网络 |
| 文章编号： | 1008-6374(2001)02-105-04 |
| 修稿时间： | 2000-11-28 |
Development Tendency of BIT |
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| ZHANG Hong wei,LI Zhi qiang,FENG Ji ping. Development Tendency of BIT[J]. Journal of Test and Measurement Techol, 2001, 15(2): 105-108 |
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| Authors: | ZHANG Hong wei LI Zhi qiang FENG Ji ping |
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| Abstract: | Aim Analyze and research the development trends of BIT. Methods Expounds the development course of BIT and analyze exist problem. Results The new theory and methods of testing, detection and fault diagnosis promote development of BIT. Conclusion The development trends of BIT is: inosculated with ATE, synthetic diagnosis, intelligence ability and junction with design for testability. |
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| Keywords: | BIT ATE synthetic diagnosis artificial intelligence expert system neural networks |
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