| Abstract: | Based on the recommendation of ICTD'09 TPC members, this Special Issue of the Journal of Electronic Science & Technology of China (JESTC) contained 22 high quality papers selected from the Proceedings of 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD'09) which is fully sponsored by the IEEE Circuits and Systems Society (CASS), and is technically co-sponsored by the University of Electronic Science and Technology of China (UESTC), the Chinese Institute of Electronics (CIE), the China Instrument & Control Society (CIS), and organized by UESTC. |
