Enhancement of polymer film adhesion using acid-base interactions determined by contact angle measurements

Quantitative correlations among surface chemical composition, acid-base thermodynamics, adhesion strength, and locus-of-failure are demonstrated. Four types of functional Teflon surfaces were prepared: two acidic (containing hydroxyl and carboxyl groups), and two basic (containing acetyl and dinitrobenzoate groups). X-Ray photoelectron spectroscopy (XPS) and attenuated total reflection infrared (ATR-IR) spectroscopy were used to characterize the molecular structure of the surface region. Contact angle adsorption isotherms were determined using phenol as an acidic probe and tetrahydrofuran (THF) as a basic probe. The carboxylated surface had a higher molar ?H^ab with basic THF than the hydroxylated surface, and neither surface had any interaction with the acidic phenol probe. The acetylated surface behaved as a base, interacting with phenol but not with THF, while the dinitrobenzoyl surface had both acidic and basic character. Adhesion tests were carried out in the 180° peel mode using post-chlorinated poly(vinyl chloride) as a model acidic adhesive between pairs of each type of film. The two surfaces with basic character had significant peel strengths, while the two acidic surfaces had very low peel strengths. Scanning electron microscopy (SEM) of the basic failure surfaces showed significant plastic deformation of the Teflon polymer, while the acidic failure surfaces showed no deformation. XPS analysis of the failure surfaces confirmed interfacial failure for the acid-acid pairs, and bulk FEP failure for the acid-base pairs. These results demonstrate directly and quantitatively the enhancement of adhesive bond strength through acid-base interactions.