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Measurements and modeling of linear and nonlinear effects in striplines |
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| Authors: | D. E. Oates P. P. Nguyen G. Dresselhaus M. S. Dresselhaus C. W. Lam S. M. Ali |
| Affiliation: | (1) Lincoln Laboratory, Massachusetts Institute of Technology, 02173 Lexington, Massachusetts;(2) Department of Physics, Massachusetts Institute of Technology, 02139 Cambridge, Massachusetts;(3) Hanscom AFB, Rome Laboratory, USAF, 01731, Massachusetts;(4) Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, 02139 Cambridge, Massachusetts;(5) Hanscom AFB, Rome Laboratory, USAF, 01731, Massachusetts;(6) Department of Electrical Engineering and Computer Science and Department of Physics, Massachusetts Institute of Technology, 02139 Cambridge, Massachusetts;(7) Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 02139 Cambridge, Massachusetts |
| Abstract: | We present measurements of surface impedanceZS as a function of frequency, temperature, and rf magnetic field for high-quality epitaxial YBa2Cu3O7–x thin films using a striplineresonator technique that measures theQ of the resonator vs. input power. The results have been modeled using Ginzburg-Landau theory at moderate fields, and the Bean critical state model at high fields. Good agreement has been obtained between the model and the measurements. We also discuss the current distributions in the stripline for both low power whenZS is linear and high power whenZS is nonlinear. |
| Keywords: | Surface impedance thin film properties stripline resonators microwave properties YBa2Cu3O7– x |
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