Thermal conductivity of titanium dioxide films grown by metal-organic chemical vapor deposition

We studied the effect of the microstructures on the thermal conductivity of the titanium dioxide (TiO₂) films. TiO₂ films were grown by MOCVD, their morphologies were observed using a scanning electron microscope (SEM). The chemical composition was determined through Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA) measurements. The thermal conductivity of the in-plane direction was measured using an alternating current calorimetric method (laser-heating Angstrom method) in the temperature range of 300 to 470 K. The authors fabricated a TiO₂ film with extremely low thermal conductivity (~ 0.5 Wm^− 1 K^− 1), in which a feather-like texture is regularly arranged in the direction perpendicular to the heat flow. The origins of the extremely low thermal conductivity were studied from a microstructural viewpoint.