| EM 400电子显微镜高压快速调整原理 |
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| 引用本文： | 刘学文. EM 400电子显微镜高压快速调整原理[J]. 分析测试仪器通讯, 1995, 0(2) |
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| 作者姓名： | 刘学文 |
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| 作者单位： | 南京医科大学 南京 |
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| 摘 要： | 简要介绍了EM 400电子显微镜高压的产生、调整和故障分析,着重阐述快速调整电路原理。
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| 关 键 词： | 电子显微镜 高压 |
Principle of Rapid High Tension Adjustment for EM400 Model Electron Microscope |
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| Liu Xuewen. Principle of Rapid High Tension Adjustment for EM400 Model Electron Microscope[J]. , 1995, 0(2) |
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| Authors: | Liu Xuewen |
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| Abstract: | The generation, adjustment and trouble analysis of high tension for EM400 model electron microscope are described in this paper. And emphasis is made on principle of rapid adjustment for HT. |
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| Keywords: | electron microscope high tension |
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