Testing and diagnostics of CMOS circuits using light emission from off-state leakage current |
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| Authors: | Stellari F. Peilin Song Tsang J.C. McManus M.K. Ketchen M.B. |
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| Affiliation: | IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA; |
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| Abstract: | In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others. |
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