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基于调制度测量轮廓术的测量系统研究
引用本文:邵双运,苏显渝,苏礼坤. 基于调制度测量轮廓术的测量系统研究[J]. 激光杂志, 2004, 25(4): 34-36
作者姓名:邵双运  苏显渝  苏礼坤
作者单位:四川大学光电科学技术系 成都610064(邵双运,苏显渝),四川大学光电科学技术系 成都610064(苏礼坤)
摘    要:调制度测量轮廓术可以实现对物体的垂直测量 ,特别适合于探测表面有高度剧烈变化或不连续区域的物体 ,研究实用的基于调制度测量轮廓术的测量系统对三维传感和机器视觉有重要意义。本文从调制度测量轮廓术的原理出发 ,分析了获取条纹调制度信息的原理 ,提出了两种易于实现仪器化的垂直扫描方法 ,提出了调制度测量轮廓术的实验系统设计方法和步骤 ,给出了模拟实验结果。本文的工作对调制度测量轮廓术的实验设计和实用化有重要的意义

关 键 词:调制度焦深  调制度测量轮廓术
文章编号:0253-2743(2004)04-0034-03
修稿时间:2003-09-16

The study of the measurement system based on modulation measurement profilemetry
SHAO Shuang-yun,SU Xian-yu,SU Li-kun. The study of the measurement system based on modulation measurement profilemetry[J]. Laser Journal, 2004, 25(4): 34-36
Authors:SHAO Shuang-yun  SU Xian-yu  SU Li-kun
Abstract:It is significant to study the practical technique based on Modulation Measurement Profilemetry(MMP)that can measure the complex surface of a testing object without the difficulties due to shadow and spatial discontinuity.This paper proposed two new practical scanning techniques,by which,the imaging plane of the grating can scan the whole testing object without moving the projecting system or the testing object.Then it discussed several factors that affect the measurement accuracy in detail.The computer simulating results were presented at last.
Keywords:modulation measurement profilemetry  depth-of-modulation
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