| 分层媒质复介电常数测量的一种方法 |
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| 引用本文： | 马国田,梁昌洪. 分层媒质复介电常数测量的一种方法[J]. 微波学报, 2000, 16(2): 122-125 |
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| 作者姓名： | 马国田 梁昌洪 |
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| 作者单位： | 西安电子科技大学微波电信工程系,西安,710071 |
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| 摘 要： | 本文给出一种测量分层媒质复介电常数的方法，经过多次测量复反射系数并建立恰当的目标函数，采用遗传算法求解这一优化问题可得到分层媒质的参数。测量结果表明，对于层数校少的媒质，在各分层厚度未知的民政部下仍可测得各分层的复介电常数，同时测得分层厚度。
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| 关 键 词： | 分层媒质 复介电常数 微波测量 参数测量 |
| 修稿时间： | 1998-07-22 |
A Method for Measuring Complex Dielectric Permittivity of Layered Medium |
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| MA Guotian,LIANG Changhong. A Method for Measuring Complex Dielectric Permittivity of Layered Medium[J]. Journal of Microwaves, 2000, 16(2): 122-125 |
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| Authors: | MA Guotian LIANG Changhong |
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| Affiliation: | MA Guotian,LIANG Changhong;(Dept. of Microwave Telecommunications Engineering, Xidian Univ. Xi'an , 710071) |
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| Abstract: | A method for measuring the complex dielectric p ermittivity of layered mediums is presented.By measuring complex reflection coef ficient several times and constructing the objective function properly,the compl ex dielectric permittivity of layered medium can be evaluated using Genetic Algo rithm.The experimental results show that the complex permittivity and the length s of the mediums can be evaluated simultaneously in the case of less layers. |
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| Keywords: | Layered medium Complex dielectric permittivity Microwave measurement Genetic Algorithm |
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