| 电子产品热电耦法温升测试的不确定度评定 |
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| 引用本文： | 钟继.电子产品热电耦法温升测试的不确定度评定[J].电子质量,2009(4):61-62. |
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| 作者姓名： | 钟继 |
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| 作者单位： | 厦门出入境检验检疫局,福建,厦门,361022 |
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| 摘 要： | 对电子产品热电耦法温升测试的测最不确定度进行了分析和评定，为ISO／IEC17025体系实验室检测人员了解和掌握不确定度评定的具体方法提供参考。
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| 关 键 词： | 电子产品 热电耦 温升 测量不确定度 |
Uncertainty Evaluation for Electronic Apparatus Temperature Rise Test with Thermal Couple |
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| Zhong Ji.Uncertainty Evaluation for Electronic Apparatus Temperature Rise Test with Thermal Couple[J].Electronics Quality,2009(4):61-62. |
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| Authors: | Zhong Ji |
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| Affiliation: | Xiamen Entry-Exit Inspection and Quarantine Bureau;Fujian Xiamen 361022 |
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| Abstract: | This paper introduces the general method and analyse of uncertainty evaluation by test temperature rise with thermal couple on electronic apparatus.It is helpful for ISO/IEC17025 system laboratory to study uncertainty evaluation. |
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| Keywords: | electronic apparatus thermal couple temperature rise uncertainty in measurement |
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