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Analytical subthreshold current modeling of nanoscale ultra-thin body ultra-thin box SOI MOSFETs with a vertical gaussian doping profile
Authors:Wei  Sufen  Zhang  Guohe  Huang  Huixiang  Liu  Jing  Shao  Zhibiao  Geng  Li  Yang  Cheng-Fu
Affiliation:1.School of Microelectronics, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049, China
;2.Department of Chemical and Materials Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu District, Kaohsiung, 811, Taiwan
;3.School of Information and Engineering, Jimei University, Fujian, 361021, China
;
Abstract:Microsystem Technologies - Based on the evanescent-mode analysis, an insightful study of the channel potential is performed for the nanoscale ultra-thin body ultra-thin box SOI MOSFETs with a...
Keywords:
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