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Probe measurements of the potential distribution in anisotropic semiconductor crystals and films
Authors:V. V. Filippov  A. N. Vlasov
Affiliation:1. Lipetsk State Pedagogical University, Lipetsk, Russia
Abstract:Expressions for determination of the electric potential distribution in rectangular anisotropic semiconductor samples are presented. Practically important cases of the samples’ localization on a metal, semiconductor, or dielectric substrate are considered.
Keywords:
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