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Tribological properties of asperity arrays coated with self-assembled monolayers
Authors:Yasuhisa Ando  Yosuke Inoue  Kazuo Kakuta  Takashi Igari  Shigeyuki Mori
Affiliation:(1) National Institute of Advanced Industrial Science and Technology, Advanced Manufacturing Research Institute, 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan;(2) Chuo University, Kasuga 1-13-27, Bunkyo-ku, Tokyo, Japan;(3) Iwate University, Ueda 4-3-5, Morioka, Iwate, Japan
Abstract:The effects of a self-assembled monolayer (SAM) coating on the friction and pull-off forces were determined by using two-dimensional asperity arrays on silicon wafers. The arrays were coated with SAM composed of one of five different alkylchlorsilanes. First, two-dimensional asperity arrays were created by using a focussed ion beam (FIB) system to mill patterns on silicon plates. Each silicon plate had different patterns of equally spaced asperities. Each pattern (5 × 5 μm2) had a different radius of curvature of the asperity peaks, ranging from about 200 to 2500 nm. Then, each silicon plate was immersed in a solution of a different alkylchlorsilane in hexane (either hexyltrichlorosilane, octyltrichlorosilane, dodecyltrichlorosilane, tetradecyltrichlorosilane, or octadecyltrichlorosilane), thus coating the asperity arrays with SAM. The friction and pull-off forces on the SAM-coated arrays were measured by using an atomic force microscope (AFM) that had a square flat probe. The pull-off force for SAM-coated silicon was roughly proportional to the radius of curvature of the asperity peaks. The magnitude of the pull-off force corresponded approximately to the capillary force calculated by using the contact angle of water on the surface of SAM. The friction coefficient correlated with the inverse of the alkyl-chain length of the SAM.
Keywords:friction force  pull-off force  Laplace pressure  contact angle  chain length  atomic force microscope  focussed ion beam
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