Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation

Representative and quantitative microstructural information of cement-based materials can be obtained in the backscattered electron and X-ray modes of the scanning electron microscope (SEM). One prerequisite, of several, is to use flat specimens. Microstructures that are minimally affected by the grinding and polishing necessary to produce the flat surface can be obtained. It is essential to fill the pores of the specimen with epoxy resin prior to grinding and polishing. After hardening, the epoxy stabilizes the microstructure and enables it to withstand the stresses of grinding and polishing without alteration. In the present paper, we describe a preparation technique that we consider to have produced excellent polished specimens. The importance of epoxy impregnation is demonstrated.