| 国外模拟IC的发展现状分析 |
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| 引用本文： | 苏万市.国外模拟IC的发展现状分析[J].微电子学,1992,22(6):1-3. |
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| 作者姓名： | 苏万市 |
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| 作者单位： | 机电部第24研究所 重庆永川 |
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| 摘 要： | 本文主要根据电子整机的发展要求,从集成化、高性能和高可靠等三方面分析国外模似IC的发展,进而说明模拟IC总的发展趋势及其表现。最后指出,模拟IC正面临一个新的变革时期。
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| 关 键 词： | 系统集成化 可靠性 模拟集成电路 |
An Analysis on the State-of-the-Art of Analog IC's Abroad |
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| Su Wanshi
Sichuan Institute of Solid-State Circuits ,Yongchuan,Chongqing.An Analysis on the State-of-the-Art of Analog IC''''s Abroad[J].Microelectronics,1992,22(6):1-3. |
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| Authors: | Su Wanshi
Sichuan Institute of Solid-State Circuits Yongchuan Chongqing |
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| Affiliation: | Su Wanshi
Sichuan Institute of Solid-State Circuits 632167,Yongchuan,Chongqing |
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| Abstract: | In the light of requirements for the development of electronic systems, the overseas state-of-the-art of analog integrated circuits is reviewed and examined in regard to system integration, high performance and high reliability. The overall tendency of the analog IC development is discussed. Finally, it is concluded that analog IC's are on the verge of a new revolution. |
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| Keywords: | Analog IC System integration High performance IC High reliability IC |
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