Study of LWIR and VLWIR Focal Plane Array Developments: Comparison Between p-on-n and Different n-on-p Technologies on LPE HgCdTe |
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Authors: | O. Gravrand L. Mollard C. Largeron N. Baier E. Deborniol Ph. Chorier |
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Affiliation: | (1) LETI-MINATEC, 17 rue des martyrs, 38054 Grenoble Cedex 9, France;(2) SOFRADIR, ZI, BP 21, 38113 Veurey-Voroize, France |
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Abstract: | The very long infrared wavelength (>14 μm) is a very challenging range for the design of mercury cadmium telluride (HgCdTe) large focal plane arrays (FPAs). The need (mainly expressed by the space industry) for very long wave FPAs appears very difficult to fulfil. High homogeneity, low defect rate, high quantum efficiency, low dark current, and low excess noise are required. Indeed, for such wavelength, the corresponding HgCdTe gap becomes smaller than 100 meV and each step from the metallurgy to the technology becomes critical. This paper aims at presenting a status of long and very long wave FPAs developments at DEFIR (LETI-LIR/Sofradir joint venture). This study will focus on results obtained in our laboratory for three different ion implanted technologies: n-on-p mercury vacancies doped technology, n-on-p extrinsic doped technology, and p-on-n arsenic on indium technology. Special focus is given to 15 μm cutoff n/p FPA fabricated in our laboratory demonstrating high uniformity, diffusion and shot noise limited photodiodes at 50 K. |
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Keywords: | FPA HgCdTe VLWIR ion implantation |
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