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CTIA OTA认可中无线终端暗室纹波测量解析
引用本文:曹志强,顾 伟.CTIA OTA认可中无线终端暗室纹波测量解析[J].微波学报,2018,34(5):73-78.
作者姓名:曹志强  顾 伟
作者单位:上海海事大学物流科学与工程研究院,上海 201306
摘    要:美国无线通信和互联网协会(CTIA)制定的无线终端OTA测试标准,对于移动通信手机等产品的测试具有一定参考意义。该标准中最重要的内容是对暗室纹波性能的测量。通过CTIA OTA实验室认可对我国移动通信手机等产品的出口有益。在CTIA OTA 实验室认可中,OTA暗室的纹波性能是一个非常重要的指标,直接影响着OTA测试结果的不确定度。主要叙述了CTIA OTA实验室认可中的暗室纹波性能测量技术,具体描述了测量原理、测量方法、所用仪器及遇到问题的解决方法,研究工作对获取CTIA OTA实验室资质有着积极的意义。

关 键 词:纹波测量  无线终端暗室  无线通信和互联网协会  不确定度

Analysis of Ripple Measurement for OTA Anechoic Chamber in Assessment and Validation of CTIA OTA
CAO Zhi-qiang,GU Wei.Analysis of Ripple Measurement for OTA Anechoic Chamber in Assessment and Validation of CTIA OTA[J].Journal of Microwaves,2018,34(5):73-78.
Authors:CAO Zhi-qiang  GU Wei
Affiliation:Research Institute of Logistics Science and Engineering, Shanghai Maritime University, Shanghai 201306, China
Abstract:CTIA (Cellular Telecommunications Industry Association) developed a test standard for wireless devices, which can provide effective reference for testing of wireless communication products such as mobile phone and so on. The most important content in the test standard is ripple measurement. It is benefits for export of wireless communication products after obtaining the accreditation of the CTIA OTA laboratory. The ripple performance of the OTA anechoic chamber is a very important parameter, which directly affects the uncertainty of the OTA test results. This paper analyzes the ripple measurement technology for anechoic chamber in assessment and validation of CTIA OTA, and systematically describes the measuring principle, measuring method, test equipment and solutions to problems encountered. This work has a positive effect on obtaining the validation of CTIA OTA laboratory.
Keywords:ripple measurement  OTA anechoic chamber  CTIA  uncertainty
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