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边界扫描测试技术在硬件实验中的应用
引用本文:赵蕙,肖铁军. 边界扫描测试技术在硬件实验中的应用[J]. 微计算机信息, 2007, 23(23): 279-281
作者姓名:赵蕙  肖铁军
作者单位:江苏大学计算机科学与通信工程学院,镇江,212013
摘    要:本文提出将广泛用于测试领域的边界扫描技术应用在基于FPGA的计算机硬件实验课程中,利用边界扫描技术解决FPGA的配置和测试两大关键问题。在PC机上编写边界扫描主控器的C语言代码,驱动计算机并口对FPGA的TAP引脚进行控制,验证了使用边界扫描方法的正确性。

关 键 词:边界扫描  硬件实验
文章编号:1008-0570(2007)08-2-0279-03
修稿时间:2007-06-13

Applying Boundary-Scan to the hardware experiment curriculum
ZHAO HUI,XIAO TIEJUN. Applying Boundary-Scan to the hardware experiment curriculum[J]. Control & Automation, 2007, 23(23): 279-281
Authors:ZHAO HUI  XIAO TIEJUN
Abstract:The article proposed applying Boundary- Scan technology which is widely used in the domain of test to the computer hard- ware experiment curriculum based on FPGA. How to configure and test the FPGA using Boundary- Scan technology is the article concerned about. The TAP master running on PC is written in C Language, which drives the parallel port to control the TAP signals of the FPGA, verifying the correctness of using Boundary- Scan.
Keywords:FPGA  TAP
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