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Electrical and structural characterizations of non-polar AlGaN/GaN heterostructures
Authors:Younghun Jung  Jennifer Hite  Jihyun Kim
Affiliation:a Department of Chemical & Biological Engineering, Korea University, Seoul 136-701, Republic of Korea
b US Naval Research Lab., Power Electronic Materials Section, Washington, DC 20375, USA
Abstract:A non-polar AlGaN/GaN structure is a strong candidate for the high-voltage device that can operate in enhancement-mode compared to the depletion-mode operation that is practically unavoidable for a standard polar AlGaN/GaN structure. Growth of non-polar GaN is non-trivial and a two-step nucleation scheme was developed to produce high-quality non-polar a-plane AlGaN/GaN structures on r-plane sapphire. The anisotropic nature of non-polar GaN requires a modification to a typical polar GaN-based transistor fabrication process. A KOH wet etch proceeded by a dramatically different mechanism compared to the standard polar c-face AlGaN/GaN structure. This device with Pt/Au Schottky gate displayed a barrier height of 0.76 eV and an ideality factor of 4 at 20 °C.
Keywords:Gallium nitride  Non-polar structure  Schottky contact  Scanning electron microscopy  X-ray diffraction  Metal-organic chemical vapor deposition
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