Measurements of Thermal Diffusivity for Thin Slabs by a Converging Thermal Wave Technique |
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Authors: | Y. Joo H. Park H.-B. Chae J.-K. Lee Y.-J. Baik |
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Affiliation: | (1) Department of Mechanical Engineering, Soonchunhyang University, Shinchang myon, Asan, Chungnam, 336-745, Republic of Korea;(2) Department of Physics, Soonchunhyang University, Shinchang myon, Asan, Chungnam, 336-745, Republic of Korea;(3) Thin Film Technology Research Center, Korea Institute of Science and Technology, P.O. Box 131, Choengryang, 130-650, Republic of Korea |
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Abstract: | The measurement of thermal diffusivity for thin slabs by a converging thermal wave technique has been studied. Temperature variation at the center of the heat source ring that is produced by a pulsed high-power laser is detected by an infrared detector. A computer program based on the finite difference method is developed to analyze the thermal diffusivity of the slabs. Materials of both high thermal diffusivity (CVD diamond wafer) and low thermal diffusivity (stainless-steel foil) have been used for the measurements. The measurements have been performed by varying the size and the thickness of specimen. The converging thermal wave technique has proved to be a good method to measure the thermal diffusivity of a CVD diamond without breaking the wafer into small specimens. The technique can be applied for a small slab if the diameter of the slab is two times larger than that of the heat source ring. The sensitivity of thickness in measuring the thermal diffusivity is low for ordinary CVD diamond. The use of the converging thermal wave technique for nonhomogeneous, nonuniform, and anisotropic materials has been accomplished by applying the finite difference method. |
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Keywords: | converging thermal wave technique CVD diamond finite difference method thermal diffusivity |
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