The interfacial microstructure of joined single crystal and polycrystalline alumina |
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Authors: | L. Zeng E. D. Case M. A. Crimp |
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Affiliation: | Department of Chemical Engineering and Materials Science, 3413 Engineering Building, Michigan State University, East Lansing, MI 48824-1226, USA |
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Abstract: | The interfacial microstructures of 96 and 98% polycrystalline alumina joined with single crystal sapphire have been investigated in relation to the joining parameters. Joining has been evaluated based on either using a thin spin-on silica interlayer or by placing the alumina and sapphire in direct contact. The materials were joined by placing the coated or uncoated surfaces in contact and heating in the range of 1340–1475 °C with minimum external load. With the aid of a silica interlayer, sapphire and 98% polycrystalline alumina were successfully joined in 180 min at 1400 °C and above, while samples without a silica interlayer failed to join under these conditions. However, sapphire and 96% polycrystalline alumina were joined both with and without the use of silica interlayer. A variety of interfacial morphologies have been observed, including amorphous regions, fine crystalline alumina, and intimate contact between the sapphire and polycrystalline alumina. |
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Keywords: | Interfacial microstructures Polycrystalline alumina Joined single crystal |
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