静电感应晶体管大电流特性的改善

描述了改善静电感应晶体管(SIT)大电流特性的新方法. 首次定义了从不同角度表征SIT电特性的重要因子,如单位沟道宽度跨导、栅效率、灵敏度因子和本征静电增益. 从理论和工艺实践上研究了这些因子与几何结构之间的关系,揭示了器件电性能对几何结构和工艺参数的依赖关系. 设计建立了SIT频率参数和功率参数测试方法和电路,深入讨论了封装工艺对SIT电性能的影响.

Improvements on High Current Performance of Static Induction Transistor

Methods for improving the high current performance of static induction transistor (SIT) are presented.Many important factors,such as "trans-conductance per unit channel width" θ, "gate efficiency" η, "sensitivity factor" D,and "intrinsic static gain" μ0,that may be used to describe different aspects of the electrical performance of an SIT are first defined.The dependences of electrical parameters on the structure and technological process of an SIT are revealed for the first time.The packaging technologies are so important for the improvement of high power performance of SITs that they must be paid attention.Testing techniques and circuits for measuring frequency and power parameters of SITs are designed and constructed.The influence of packaging processes in technological practice on the electrical performance of SITs is also discussed in depth.