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The STM learning curve and where it may take us* |
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| Authors: | J. E. Demuth U. Koehler R. J. Hamers |
| Abstract: | The scanning tunnelling microscope (STM) has proved to be an extraordinary method to investigate surfaces in vacuum, air and liquid environments. Several issues regarding the use of the STM for atomic resolution studies are discussed. These include electronic contributions to STM images, the role of the tip in resolution and spectroscopy, as well as the need for complementary information about chemical composition or sub-surface structure. |
| Keywords: | Scanning tunnelling microscopy surface electronic structure tunnelling tips tip electronic structure |