| 基于确定性测试图形的BIST构建方法 |
| |
| 引用本文： | 葛鹏岳,黄考利,刘晓芹,连光耀.基于确定性测试图形的BIST构建方法[J].计算机测量与控制,2011,19(4). |
| |
| 作者姓名： | 葛鹏岳 黄考利 刘晓芹 连光耀 |
| |
| 作者单位： | 军械工程学院军械技术研究所,河北,石家庄,050003 |
| |
| 摘 要： | 为降低内建自测试(Build-in Self Test,BIST)的测试功耗,提出了一种基于确定性测试图形的内建自测试构建方法:首先采用D算法生成测试所需的测试图形,然后使用粒子群算法对其进行优化,使内建自测试的功耗大幅度降低;文中最后以ISCAS'85Benchmark中的部分电路作为实验对象,并给出了测试图形优化前后的功耗数;实验结果证明该方法能够有效降低内建自测试的测试功耗,并且具有方法简单、无需额外硬件开销的特点.
|
| 关 键 词： | 内建自测试 确定性测试图形 粒子群优化算法 |
Method Based on Deterministic Test Pattern for Designing BIST |
| |
| Ge Pengyue,Huang Kaoli,Liu Xiaoqin,Lian Guangyao.Method Based on Deterministic Test Pattern for Designing BIST[J].Computer Measurement & Control,2011,19(4). |
| |
| Authors: | Ge Pengyue Huang Kaoli Liu Xiaoqin Lian Guangyao |
| |
| Affiliation: | Ge Pengyue,Huang Kaoli,Liu Xiaoqin,Lian Guangyao(Ordnance Technological Research Institute Of Ordnance Engineering College,Shijiazhuang 050003,China) |
| |
| Abstract: | In order to reduce the power dissipation of biuld-in self test(BIST),this paper proposed a method based on deterministic test pattern for designing BIST.Firstly,we used D algorithm to generate test pattern for testing;then we used particle swarm optimization to optimized the test pattern.In the end of this paper,we took some circuits of ISCAS'85 Benchmark as our circuit under test and present the result.The experiment proves that this method for designing BIST can not only reduce power dissipation of BIST b... |
| |
| Keywords: | biiuld-in self test deterministic test pattern particle swarm optimization |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
