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Prediction of Yield in a Multiproduct Batch Production Environment |
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| Authors: | V. Roshan Joseph Harsha Adya |
| Affiliation: | a Department of Statistics, University of Michigan, Ann Arbor, MI, U.S.A.b AT & S India Limited, Mysore, Karnataka, India |
| Abstract: | |
| Keywords: | PCB Complexity parameters Logistic regression Product-related defects Process-related defects Bayesian estimation Beta-binomial distribution |
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