首页 | 本学科首页   官方微博 | 高级检索  
     

超低副瓣天线近场测试关键技术探讨
引用本文:张士选,李勇,张福顺,傅德民,毛乃宏. 超低副瓣天线近场测试关键技术探讨[J]. 西安电子科技大学学报(自然科学版), 2000, 27(3): 368-374
作者姓名:张士选  李勇  张福顺  傅德民  毛乃宏
作者单位:西安电子科技大学,天线与微波技术国家重点实验室,陕西,西安,710071  
基金项目:国家部委预研基金资助项目! (7 4 9 2 )
摘    要:文中就超低瓣天线近场测试所涉及的若干关键技术和直接影响测试计算精度的各类误差源进行了探讨,特别对有关的误差分析补偿方法进行了全面的阐述,提出 理论研究和工程实用价值的见解,通过在西安电子科技科技大学研制的近场测试系统上的计算机仿真和实验研究,结果表明,只要进行一步提高测试系统的硬软件精度,并进行严格的误差分析补偿的诊断调整,实现超低副瓣天线的近场测试则是完全有效的。

关 键 词:超低副瓣天线 近场测量 误差源
修稿时间:1999-08-11

A study of techniques for measuring ultra-low-sidelobe antennas by the near-field method
ZHANG Shi-xuan,LI Yong,ZHANG Fu-shun,FU De-min,MAO Nai-hong. A study of techniques for measuring ultra-low-sidelobe antennas by the near-field method[J]. Journal of Xidian University, 2000, 27(3): 368-374
Authors:ZHANG Shi-xuan  LI Yong  ZHANG Fu-shun  FU De-min  MAO Nai-hong
Abstract:This paper presents some key techniques for measuring ultra low sidelobe antennas by near field scanning, and discusses various error sources that directly affect the measurement accuracy. Emphasis is placed on the error analysis and correction method for these error sources, and the suggestions for theoretical analysis and practical engineering methods are proposed. Computer simulations and experiments are performed in teh near field system developed at Xidian University. The results obtained show that the realization of ultra low sidelobe antenna measurement by near field scanning is possible only if the hardware and software accuracy of the test system are further enhanced and the error diagnosis and correction are rigorously made.
Keywords:ultra-low sidelobe antennas  near field  error sources  error analysis and correcting  measurement system
本文献已被 维普 等数据库收录!
点击此处可从《西安电子科技大学学报(自然科学版)》浏览原始摘要信息
点击此处可从《西安电子科技大学学报(自然科学版)》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号