Investigation of moisture ingress into adhesive bonded structures using high frequency dielectric analysis |
| |
Authors: | ZHI-CHENG LI D HAYWARD R GILMORE R A PETHRICK |
| |
Affiliation: | (1) Department of Pure and Applied Chemistry, Thomas Graham Building, University of Strathclyde, 295 Cathedral Street, Glasgow, G1 1XL, UK;(2) Defence Research Agency, Structural Materials Centre, Farnborough Hants, GU14 6TD, UK |
| |
Abstract: | The effects on the dielectric characteristics of aluminium-adhesive bonded joint structures with different surface treatments
on exposure to moisture at elevated temperatures are reported. Analysis of the frequency domain data as a function of the
exposure time allows three major ageing processes to be identified; plasticization of the adhesive, changes in the state of
interfacial oxide and generation of disbonded areas. Time domain data allows identification of regions where changes in the
characteristics of the bond have occurred and complements the data obtained from frequency domain data. Mechanical tests on
joints aged for 733 days indicate a large decrease in the shear strength has occurred consistent with the detection of marked
changes in the dielectric traces. Anodization of the substrate increases the durability of joints in comparison with etched
samples. This study illustrates the potential of this method for in-situ characterization of changes occurring both within
the adhesive and the adhesive substrate interface.
This revised version was published online in November 2006 with corrections to the Cover Date. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|