| 原子力显微镜在分子自组装研究中的应用 |
| |
| 引用本文： | 潘冰,董申,闫永达,赵健伟.原子力显微镜在分子自组装研究中的应用[J].机械工程师,2006(5):68-70. |
| |
| 作者姓名： | 潘冰 董申 闫永达 赵健伟 |
| |
| 作者单位： | 1. 哈尔滨工业大学精密工程研究所,黑龙江,哈尔滨,150001
2. 南京大学化学化工学院,江苏,南京,210093 |
| |
| 摘 要： | 原子力显微镜(AFM)以其分辨率高、样品无需特殊制备、实验可在大气环境中进行等优点被广泛应用于分子自组装这种自下而上的微细加工技术的研究中。近年来,随着对自组装行为研究的深入,其应用已由对自组装分子表面几何形貌的观测发展到制备纳米级结构和表征表面其它性能的研究领域。文中在简单介绍AFM及分子自组装优势的基础上,总结了AFM在自组装研究方面的若干新应用,并对其应用前景作出展望。
|
| 关 键 词： | 分子自组装 纳米刻蚀 |
| 文章编号： | 1002-2333(2006)05-0068-03 |
| 收稿时间： | 2006-01-18 |
| 修稿时间： | 2006年1月18日 |
Application of Atomic Force Microscope on Self-assembly Study |
| |
| PAN Bing,DONG Shen,YAN Yong-da,ZHAO Jian-Wei.Application of Atomic Force Microscope on Self-assembly Study[J].Mechanical Engineer,2006(5):68-70. |
| |
| Authors: | PAN Bing DONG Shen YAN Yong-da ZHAO Jian-Wei |
| |
| Affiliation: | 1.Center for Precision Engineering.Harbin Institute of Technology,Harbin 15001,China;2.Department of Chemistry ,Nanjing University ,Nanjing 210093,China |
| |
| Abstract: | Recently, Atomic force microscope (AFM) has become a powerful technique in self-assembly field owing to its many advantages. In this mini-review, its application in self-assembly study is given briefly such as the characterization of the surface morphology and properties, fabricating nanometer scale structure, and the investigation of self-assembly on nanometer scale, which is based on the introduction of the superiority of AFM as well as self-assembly. |
| |
| Keywords: | AFM |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
