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Pragmatic evaluation of fin height and fin width combined variation impact on the performance of junctionless transistors |
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| Authors: | Ribeiro Thales Augusto Cerdeira Antonio Estrada Magali Barraud Sylvain Pavanello Marcelo Antonio |
| Affiliation: | 1.Department of Electrical Engineering, Centro Universitário FEI, S?o Bernardo do Campo, Brazil ;2.Sección de Electrónica de Estado Sólido, CINVESTAV-IPN, Mexico City, Mexico ;3.Département des Composants Silicium – SCME/LCTE CEA, LETI, MINATEC Campus,, Univ. Grenoble Alpes, Grenoble, France ; |
| Abstract: | Journal of Computational Electronics - This work performs a pragmatic evaluation of the different junctionless devices architectures with channel lengths down to 30 nm on their electrical... |
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