首页 | 本学科首页   官方微博 | 高级检索  
     

W/Al双层膜系的纳米压痕实验及有限元仿真
引用本文:尚帅华,杨平,李春. W/Al双层膜系的纳米压痕实验及有限元仿真[J]. 电子元件与材料, 2009, 28(11). DOI: 10.3969/j.issn.1001-2028.2009.11.017
作者姓名:尚帅华  杨平  李春
作者单位:江苏大学,微纳米科学技术研究中心,江苏,镇江,212013;江苏大学,微纳米科学技术研究中心,江苏,镇江,212013;江苏大学,微纳米科学技术研究中心,江苏,镇江,212013
基金项目:江苏省自然科学基金资助项目,广西自然科学基金资助项目 
摘    要:采用磁控溅射法在CAT.No.7101玻璃基底上沉积了W/Al双层金属膜,并对其进行纳米压痕实验。利用非线性有限元法对压痕过程进行仿真,分析了膜基体系的应力分布。结果表明:磁控溅射法制备的薄膜组织均匀、力学性能好。W/Al双层金属膜系中的W薄膜的弹性模量与硬度平均值分别为75.4335GPa、6.206GPa,其值与块状W材料的相应参数差别较大。仿真曲线与实验结果基本相符,能够反映出膜基体系的力学状态以及应力分布规律。

关 键 词:磁控溅射  纳米压痕  力学性能  有限元仿真  应力分布

Nano-indentation experiment of W/Al bilayer-film system and its finite element simulation
SHANG Shuaihua,YANG Ping,LI Chun. Nano-indentation experiment of W/Al bilayer-film system and its finite element simulation[J]. Electronic Components & Materials, 2009, 28(11). DOI: 10.3969/j.issn.1001-2028.2009.11.017
Authors:SHANG Shuaihua  YANG Ping  LI Chun
Abstract:W/Al bilayer-metal films were deposited on CAT.NO.7101 glass substrates using the magnetron sputtering method. Nano-indentation test was performed on the observed film samples. The loading and unloading processes of nano-indentation tests were simulated via the non-linear finite element method, and the stress distribution in the film-substrate system was analyzed. The results show that W/Al films fabricated by the magnetron sputtering method exhibit uniform structure and good mechanical properties. The elastic modulus and the mean value of hardness of W film in the W/Al bilayer-metal films are 75.433 5 GPa and 6.206 GPa respectively, which are quite different from the corresponding parameters of bulk W. The simulation curves well agree with the experimental results and clearly reflect the mechanical states as well as stress distribution of the film-substrate system.
Keywords:magnetron sputtering  nano-indentation  mechanical properties  finite element simulation  stress distribution
本文献已被 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号