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A testing-effort dependent software reliability model and its application |
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| Authors: | Shigeru Yamada Hiroshi Ohtera Hiroyuki Narihisa |
| Affiliation: | 1. National Key Laboratory of Strength and Structural Integrity, Institute of Solid Mechanics, School of Aeronautic Science and Engineering, Beihang University, Beijing 100191, China;2. Aircraft and Propulsion Laboratory, Ningbo Institute of Technology, Beihang University, Ningbo 315100, China;3. China Academy of Aerospace Science and Innovation, Beijing 100176, China;1. Faculty of Computer Science and Information Technology, Universiti Putra Malaysia (UPM), Seri Kembangan, Malaysia;2. Department of Computing, FSKIK, Universiti Pendidikan Sultan Idris, Tanjung Malim, Malaysia |
| Abstract: | We discuss a software reliability growth model with testing-effort based on a nonhomogeneous Poisson process and its application to a testing-effort control problem. The time-dependent behaviour of testing-effort expenditures which is incorporated into software reliability growth is expressed by a Weibull curve due to the flexibility in describing a number of testing-effort expenditure patterns. Using several sets of actual software error data, the model fitting and examples of a testing-effort control problem are illustrated. |
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