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Knowledge-based linguistic equations for defect detection through functional testing of printed circuit boards
Authors:Sébastien Gebus  Esko Juuso  Kauko Leiviskä
Affiliation:1. Department of Psychiatry and Behavioral Sciences, Johns Hopkins Bayview, School of Medicine, The Johns Hopkins University, Baltimore, MD;2. Department of Gerontology and Geriatric Medicine, Johns Hopkins Bayview, School of Medicine, The Johns Hopkins University, Baltimore, MD;3. Dartmouth Centers for Health and Aging, Community & Family Medicine, The Dartmouth Medical School, Lebanon, NH;1. University of Miami Center on Aging, Miami, FL;2. Dartmouth Centers for Health and Aging, Geisel School of Medicine at Dartmouth, Hanover, NH;3. NIMH Center for Late Life Depression Prevention and Treatment, University of Pittsburgh School of Medicine and Graduate School of Public Health, Pittsburgh, PA;4. Center for Multicultural Mental Health Research, Cambridge Health Alliance, Somerville, MA;5. Center for Health Equity, School of Public Health, University of Maryland, College Park, MD
Abstract:Increasing globalization of the economy is imposing tough challenges to manufacturing companies. The ability to produce highly customized products, in order to satisfy market niches, requires the introduction of new features in automation systems. Flexible manufacturing processes must be able to handle unforeseen events, but their complexity makes the supervision and maintenance task difficult to perform by human operators.This paper describes how linguistic equations (LE), an intelligent method derived from Fuzzy Algorithms, has been used in a decision-helping tool for electronic manufacturing. In our case the company involved in the project is mainly producing control cards for the automotive industry. In their business, nearly 70% of the cost of a product is material cost. Detecting defects and repairing the printed circuit boards is therefore a necessity. With an ever increasing complexity of the products, defects are very likely to occur, no matter how much attention is put into their prevention. Therefore, the system described in this paper comes into use only during the final testing of the product and is purely oriented towards the detection and localization of defects. Final control is based on functional testing. Using linguistic equations and expert knowledge, the system is able to analyze that data and successfully detect and trace a defect in a small area of the printed circuit board. If sufficient amount of data is provided, self-tuning and self-learning methods can be used. Diagnosis effectiveness can therefore be improved from detection of a functional area towards component level analysis.
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