基于SimpleSim-ARM模拟器的软错误易感性分析与评估

随着集成电路特征尺寸的逐步缩小，随之而来快速增长的软错误率严重限制了现代微处理器的应用，因此对微处理器可靠性进行评估十分重要。在微处理器体系结构级进行软错误易感性评估能反映出微处理器部件的可靠性，提出基于SimpleSim-ARM模拟器对微处理器体系结构级进行软错误易感性评估的方法，可用于对ARM体系结构微处理器进行软错误易感性评估。根据提出方法对StrongARM SA-11xx进行软错误易感性分析，实验结果表明，在基准配置情况下，存储部件中寄存器文件的平均AVF值为57.76%；非存储部件发射队列（IQ）、保留站与重定序缓冲（RUU）与功能单元（FUs）的平均AVF值分别为38.53%、32.02%和12.39%。在不同配置下，IQ和RUU部件容量越大，对应部件AVF评估值越小；FUs数量越多，该部件AVF评估值越小。

Soft error vulnerability analysis and evaluation based on SimpleSim-ARM

With the continuous shrinkage of feature size of integrated circuits, the increasing soft error rates seriously restrict the applications of modern microprocessors, making it very important to evaluate the reliability of microprocessors. A soft error vulnerability of microprocessor''s structures can reflect the reliability of structures. This paper proposed an architectural level soft error vulnerability analysis method based on the SimpleSim-ARM for ARM microprocessors. Using the method to analyze the soft error vulnerability of StrongARM SA-11xx, the experimental results show when choosing the defined configuration, the average AVF values of the register files, issue queue(IQ), reservation station and reorder buffer(RUU) and function units(FUs) are 57.76%, 38.53%, 32.02% and 12.39%, respectively. In different configurations, the larger the IQ and RUU component capacity, the smaller the AVF evaluation value. The larger the number of FUs, the smaller the AVF evaluation value.