| 数字阵列模块老炼系统的研制 |
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| 引用本文： | 何宏平,张伟. 数字阵列模块老炼系统的研制[J]. 电子产品可靠性与环境试验, 2011, 29(6): 39-42 |
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| 作者姓名： | 何宏平 张伟 |
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| 作者单位： | 华东电子工程研究所,安徽合肥,230031 |
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| 摘 要： | 数字阵列模块的筛选是剔除早期失效、提高产品使用可靠性的重要手段,而电老炼是其中重要的环节.针对数字阵列模块筛选的具体需求,提出了研究实用化的电老炼系统并详细阐述了系统设计方案,以达到提高产品可靠性的目的.
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| 关 键 词： | 数字阵列模块 筛选 电老炼系统 设计方案 |
Development of Burn-in System for Digital Array Module |
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| HE Hong-ping,ZHANG Wei. Development of Burn-in System for Digital Array Module[J]. Electronic Product Reliability and Environmental Testing, 2011, 29(6): 39-42 |
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| Authors: | HE Hong-ping ZHANG Wei |
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| Affiliation: | (East China Research Institute of Electronic Engineering,Hefei 230031,China) |
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| Abstract: | The screening of digital array modules is an important technique for eliminating infant mortalities and improving the reliability of products,and the electric burn-in is a very important part of it.Based on the specific requirements for the screening of digital array modules,a practical electric burn-in system is developed and the detailed design of the system is presented to improve the reliability of the products. |
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| Keywords: | digital array module screening electric burn-in system design |
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