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碲镉汞光导器件的交叠结构与性能
引用本文:雷莹. 碲镉汞光导器件的交叠结构与性能[J]. 红外与激光工程, 1998, 27(1): 52-55
作者姓名:雷莹
作者单位:津航技术物理研究所
摘    要:光数载流子扫出效应是限制碲镉汞(HgCdTe)光导器件性能提高的重要因素之一。交叠结构的光导器件能有效地消除少数载流子扫出效应,就结构的尺寸问题,进行了理论分析和实验,实验结果与理论符合,器件呼应率有较大的提高。

关 键 词:碲镉汞 光导器件 交叠结构

OVERLAP STRUCTURE AND PERFORMANCE OF HgCdTe PHOTOCONDUCTIVE DEVICE
Lei Ying. OVERLAP STRUCTURE AND PERFORMANCE OF HgCdTe PHOTOCONDUCTIVE DEVICE[J]. Infrared and Laser Engineering, 1998, 27(1): 52-55
Authors:Lei Ying
Abstract:Minority - carrier sweepout is one of the important factors limiting the performance of HgCdTe photoconductive device . The overlap structure proposed by Kinch M A can restrain minority - carrier sweepout . Contents of theoretical analysis and experiments on the overlap length of this structure are given in this paper. The experimental result fits well with theoretical mode and the re- sponsivity of the device is raised greatly .
Keywords:HgCdTe Photoconductive device Overlap structure
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