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Time-censored ramp tests with stress bound for Weibull lifedistribution
Authors:Bai  DS Chun  YR Cha  MS
Affiliation:Dept. of Ind. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon;
Abstract:This paper considers ramp tests for Weibull life distribution when there are limitations on test stress and test time. The inverse power law and a cumulative exposure model are assumed. Maximum likelihood estimators of model parameters and their asymptotic covariance matrix are shown. The optimum ramp test plans are given which minimize the asymptotic variance of the ML estimator of a specified quantile of log(life) at design constant stress. The effects of the pre-estimates of design parameters are studied
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