Properties of InAs/(Ga,In)Sb strained layer superlattices grown on the {111} orientations |
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Authors: | J A Dura J T Zborowski T D Golding D Donnelly W Covington |
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Affiliation: | (1) Department of Physics and Space Vacuum Epitaxy Center, University of Houston, 77204 Houston, TX;(2) Department of Physics, Sam Houston State University, 77341 Huntsville, TX |
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Abstract: | Following the proposal of the extreme type-II InAs/(Ga,In)Sb strained layer superlattice system by Mailhiot and Smith in 1987
for long wavelength infrared detection, a number of groups have experimentally investigated (100) oriented InAs/(Ga,In)Sb
strained layer superlattices and demonstrated that these structures can possess energy gaps in the 8–12 μm range with absorption
coefficients comparable to HgCdTe. However, a number of advantages are predicted if these structures are grown on the {111}
orientations. In this paper, we present details of our investigation of the growth of InAs/GaSb heterostructures and InAs/(Ga,In)Sb
strained layer superlattices on the (111)A and (111)B orientations by molecular beam epitaxy, compared to growth on the (100)
orientation. Heterojunction growth and incorporation rates of Sb (As) into InAs (GaSb) on (111)A, (111)B, and (100) orientations
have been assessed and implications for growth and optical properties of InAs/(Ga,In)SB strained layer superlattices are discussed.
GaSb/InAs and InAs/GaSb interfaces on the (111)B orientation are investigated by x-ray photoelectron spectroscopy, and the
structural quality of InAs/(Ga,In)Sb strained layer superlattices are investigated by x-ray diffraction. |
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Keywords: | InAs/GaInSb strained-layer superlattices MBE x-ray photoelectron spectroscopy x-ray diffraction |
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