Admittance-Curve-Fitting Method for Semiconductive Piezoelectric Ceramics |
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| Authors: | Takaaki Tsurumi Takashi Ichihara Kiyoshi Asaga Masaki Daimon |
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| Affiliation: | Department of Inorganic Materials, Faculty of Engineering, Tokyo Institute of Technology, Tokyo 152, Japan |
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| Abstract: | The admittance-curve-fitting method is proposed to determine material coefficients of semiconductive piezoelectric ceramics. In this method, the frequency dependence of admittance of a plate resonator is calculated around the resonance frequency, and the piezoelectric, elastic, and dielectric coefficients in the theoretical formula are refined to fit the observed data. The result of a simulation using four types of hypothetical ceramics with different conductivities and electromechanical coupling factors indicates that various constants determined by this method are more accurate than those by the conventional method. The fitting method is applied practically to the PZT ceramics and Bi,K-doped PZT ceramics which show semiconductivity. |
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| Keywords: | piezoelectric materials lead zirconate titanate dielectric materials perovskites semiconductors |
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