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High-speed path-length scanning with a multiple-pass cavity delay line
Authors:Hsiung Pei-Lin  Li Xingde  Chudoba Christian  Hartl Ingmar  Ko Tony H  Fujimoto James G
Affiliation:Department of Electrical Engineering and Computer Science and the Research Laboratory of Electronics, Massachusetts Institute of Technology, Building 36-345,50 Vassar Street, Cambridge, Massachusetts 01239, USA.
Abstract:Techniques for high-speed delay scanning are important for low-coherence interferometry, optical coherence tomography, pump probe measurements, and other applications. We demonstrate a novel scanning delay line using a multiple-pass cavity. Differential delays are accumulated with each pass so that millimeter delays can be generated with tens of micrometer mirror displacements. With special design criteria, misalignment sensitivity can be dramatically reduced. The system is demonstrated to scan 6 m/s at 2-kHz repetition rates. Real-time optical coherence tomography imaging with 500 pixel images at four frames/s is performed. Using a Cr:forsterite laser source, we obtained axial image resolutions of 6 microm with 92-dB sensitivity.
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