Enhanced geometrical superresolved imaging with moving binary random mask |
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Authors: | Borkowski Amikam Zalevsky Zeev Marom Emanuel Javidi Bahram |
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Affiliation: | School of Engineering, Tel-Aviv University, 69978 Tel-Aviv, Israel. |
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Abstract: | In this paper, we address the geometrical resolution limitation of an imaging sensor caused by the size of its pixels yielding insufficient spatial sampling of the image. The spatial blurring that is caused due to inadequate sampling can be resolved by placing a two-dimensional binary random mask in an intermediate image plane and shifting it along one direction while keeping the sensor as well as all other optical components fixed. Out of the set of images that are captured, a high resolution image can be decoded. In addition, this approach allows improved robustness to spatial noise. |
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