A methodological approach for combining super-resolution and pattern-recognition to image identification

Image acquisition systems integrated with laboratory automation produce multi-dimensional datasets. An effective computational approach for automatic analysis of image datasets is given by pattern recognition methods; in some cases, it can be advantageous to accomplish pattern recognition with image super-resolution procedures. In this paper, we define a method derived from pattern recognition techniques for the recognition of artefacts and noise on set of images combined with super resolution algorithms. The advantage of our approach is automatic artefacts recognition, opening the possibility to build a general framework for artefact recognition independently by the specific application where it is used.