Caractéristiques Courant-Tension Des Structures Ti/TiO2/Électrolyte Et Ti/TiO2/Métal: Effet Schottky Et Claquage |
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Authors: | R Jérisian JC Marchenoir JP Loup |
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Affiliation: | Laboratoire de Physique Electronique et Thermodynamique des Oxydes, Faculté des Sciences de Tours, 37 200 Tours France |
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Abstract: | Anodic layers of TiO2 were made with a potentiostatic setting and voltages from 1 to 90 V in 1 N sulphuric acid. The current-applied voltage characteristics of the structures Ti/TiO2/Au and Ti/TiO2/electrolyte are compared and analysed with the Schottky mechanism. The barrier heights calculated for the rectifying interfaces TiO2-Au and TiO2-electrolyte are respectively 1.2±0.1 eV and 0.88±0.05 eV. Three domains of voltage were distinguished for the anodic oxidation of titanium in the potentiostatic mode as follows: from 1 to 10 V corresponding to a natural oxide thin layer and the beginning of anodic oxidation; from 10 to 90 V corresponding to oxidation with electronic breakdown; beyond 90 V relating to oxidation accompanied by thermal breakdown. |
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