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Optical properties of CdTe thin films studied by photothermal deflection spectroscopy |
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| Authors: | J.G. Mendoza-Alvarez B.S.H. Royce F. Sánchez-Sinencio O. Zelaya-Angel C. Menezes R. Triboulet |
| Affiliation: | Applied Physics and Materials Laboratory, Princeton University, Princeton, NJ 08544, U.S.A.;Centro de Investigación del Instituto Politecnico National, Apartado Postal 14-740, 07000 Mexico City Mexico;Laboratoire de Physique des Solides associé au CNRS, 1 place A. Briand, 92190 Meudon-Bellevue Cédex, France |
| Abstract: | Photothermal deflection spectroscopy (PDS) was used to analyze CdTe thin films which are to be used to construct solar cells. It was found that CdTe thin films grown on a conducting SnO2 layer deposited on glass show deviations from a stoichiometric composition due to an excess of tellurium. This non-stoichiometry modifies the absorption spectrum obtained from the PDS measurements. |
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