微波场效应管工作寿命试验中的防振荡措施 |
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引用本文: | 孙伟东,孙婉鸣. 微波场效应管工作寿命试验中的防振荡措施[J]. 固体电子学研究与进展, 1988, 0(1) |
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作者姓名: | 孙伟东 孙婉鸣 |
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作者单位: | 南京电子器件研究所(孙伟东),南京电子器件研究所(孙婉鸣) |
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摘 要: | 本文对GaAs微波场效应管工作寿命试验中的防振荡问题作了进一步研究。证实了试验中表现为低频振荡现象的实质是存在微波振荡。选择具有良好吸收性能的铁氧体橡皮作为吸收负载,有效地消除了振荡现象。本文着重从理论上分析了吸收材料的参数与防振荡效果之间的关系。
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An Anti-Oscillation Measure Adopted in Operation Life Test of Microwave GaAs FET |
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Abstract: | The measure of preventing microwave GaAs FET from oscillating during operation life test has been studied. It is shown that the low frequency oscillation obssrved in the test is due to the existence of microwave oscillation. The microwave oscillation can be effectively elimimated by a proper ferrite-rubber material. The relationship between the parameters of the absorbing material and its anti-oscillation results is analysed. |
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