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3D Investigation of 8-nm Tapered n-FinFET Model |
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| Authors: | N Boukortt S Patan&#; G Crupi |
| Affiliation: | N. Boukortt,S. Patanè,G. Crupi |
| Abstract: | The miniaturization has become a key word for advanced integrated circuits over the last few years. It is within this context that the fin field effect tra |
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