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Mobility fluctuation1/f noise in silicon p+-n-p transistors
Authors:J. Kilmer  A. van der Ziel  G. Bosman
Affiliation:Department of Electrical Engineering, University of Florida, Gainesville, FL 32611, U.S.A.
Abstract:A study of the current dependence of base 1/f noise and of collector 1/f noise in p+-n-p transistors shows that the former is most likely of the mobility fluctuation 1/f noise type and that the latter is most probably not of that type. The current dependence of 1/f noise in transistors is a powerful tool in the interpretation of the noise.
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