Mobility fluctuation1/f noise in silicon p+-n-p transistors |
| |
Authors: | J. Kilmer A. van der Ziel G. Bosman |
| |
Affiliation: | Department of Electrical Engineering, University of Florida, Gainesville, FL 32611, U.S.A. |
| |
Abstract: | A study of the current dependence of base 1/f noise and of collector 1/f noise in p+-n-p transistors shows that the former is most likely of the mobility fluctuation 1/f noise type and that the latter is most probably not of that type. The current dependence of 1/f noise in transistors is a powerful tool in the interpretation of the noise. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |